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From The Free On-line Dictionary of Computing (05 January 2017) [foldoc]:
scan design
Scan-In, Scan-Out
(Or "Scan-In, Scan-Out") A electronic circuit
design technique which aims to increase the controllability
and observability of a digital logic circuit by
incorporating special "scan registers" into the circuit so
that they form a scan path.
Some of the more common types of scan design include the
multiplexed register designs and {level-sensitive scan
design} (LSSD) used extensively by IBM. Boundary scan can
be used alone or in combination with either of the above
techniques.
["Digital Systems Testing and Testable Design" by Abramovici,
Breuer, and Friedman, ISBN 0-7167-8179-4].
["Design of Testable Logic Circuits" by R.G. Bennetts,
(Brunel/Southhampton Universities), ISBN 0-201-14403-4].
(1995-02-23)